Wim van der Linden, Ph.D., is CTB's Chief Research Scientist. He leads CTB's research agenda and serves as a consultant on technical issues to CTB Research staff members.

Dr. van der Linden is an internationally-recognized expert in the field of psychometrics, with more than three decades of publications in the international literature. His vast knowledge in the art and science of educational assessment leads CTB's research agenda, and helps to shape the next generation of assessments.

Prior to joining CTB in 2008, Dr. van der Linden was Professor of Measurement and Data Analysis at the University of Twente in the Netherlands.

He has served on the editorial boards of Applied Psychological Measurement, Journal of Educational Measurement, Psychometrika, European Review of Applied Psychology, Dutch Journal of Education, Dutch Journal of Educational Research, and International Journal of Testing. In addition, he is a co-editor for the Springer Series on Statistics for Social and Behavioral Sciences, and has been a member of boards and committees of numerous national and international professional organizations.

He is co-editor of three published volumes: Handbook of Modern Item Response Theory (New York: Springer, 1997; with R. K. Hambleton), Computerized Adaptive Testing: Theory and Applications (Boston: Kluwer, 2000; with C. A. W. Glas), and its sequel Elements of Adaptive Testing (New York Springer, 2010; with C. A. W. Glas). He is also the author of Linear Models for Optimal Test Design published by Springer in 2005. Currently, he works on Introduction to Test Theory and its Applications, also to be published by Springer.

Ph.D., Psychometrics, University of Amsterdam
M.S., Psychology, University of Utrecht
M.S., Sociology, University of Utrecht
B.S., Psychology, University of Utrecht
B.S., Sociology, University of Utrecht

Awards and Recognitions

  • E.F. Lindquist Award, American Educational Research Association, 2009
  • Honorary Doctorate, Faculty of Social Sciences, Umeå University, Sweden, 2007
  • Career Achievement Award, Association of Test Publishers (ATP), 2006
  • Career Achievement Award, National Council on Measurement in Education (NCME), 2005
  • Fellow of the Center for Advanced Study in the Behavorial Sciences, Stanford University, 2002-03


  • Automated test assembly
  • Test design
  • Test theory (IRT)
  • Optimal test assembly
  • Response-time modeling
  • Modeling response times on test items
  • IRT
  • Equating methods
  • Computer adaptive testing
  • Bayesian methods
  • Markov-chain Monte Carlo (MCMC) methods
  • Cheating analysis
  • Item and test security